2022 NEPP ETW Presentation Materials

... Back to the 2022 NEPP ETW Home Page

File	Size
All 2022 NEPP ETW Talks
2022_NEPP_ETW_Talks.zip	179209 K
13-JUN-2022-MON
File	Size
0900 - Majewicz - The State of NEPP NASA Electronic Parts & Packaging Program	756 K
0930 - Douglas -NASA EEEE Parts Management - Overview and Status	258 K
0955 - Liddle - Invited Talk: CHIPS for America Act Programs: Supporting a Strong U.S. Semiconductor Industry	2310 K
1015 - Forsbacka - What's the Deal with Digital Transformation and Safety and Mission Assurance?	661 K
1055 - Geithner - The James Webb Space Telescope: Unfolding the Universe	7520 K
1125 - Jeffers - James Webb Space Telescope(JWST) EEE Parts Program Report	1196 K
1150 - Siddiqi - NASA Testing & Derating Document Update	1624 K
1215 - Gaza - NASA Radiation Hardness Assurance (RHA) Standard: Status for 2022	486 K
1340 - Agarwal - NEPAG Report NASA Electronic Parts Assurance Group	3326 K
1400 - Agarwal - Electronic Parts and ESD Update: Gaps and Mitigation Strategies Lessons Learned	6728 K
1420 - Schuler - Government Working Group (GWG) Update	1246 K
1440 - Pandolf - NEPP/NEPAG DC/DC Converter & Hybrid Working Group	776 K
1515 - Agarwal - MIL-PRF-38535 Standard Microcircuits Hermetic and Non-hermetic	3002 K
1540 - Popelar - Overview of the CAES Organic Class Y PIDTP	3339 K
1605 - Cozzolino - MIL-STD-1580 (DPA for EEE Parts) Task Group Status Electronics Technology Workshop	77 K
1620 - Cozzolino - MIL-PRF for Extended Range Stacked Ceramic Capacitors	79 K
1635 - Shinichiroh - On-orbit Validation to Mitigate Tin Whisker Growth (3rd year)	6980 K
14-JUN-2022-TUE
File	Size
0900 - Matzkind - Department of Defense and Heavy-Ion (HI) Single Event Effects (SEE) Facilities	2282 K
0920 - Meyers/Turner - RADFX Scheduling Tool	1111 K
0940 - Yarbrough - Enabling Radiation Test Data Sharing – The Aerospace Corporation’s Support to the NASA Space Environments Testing Management Office	11692 K
1005 - Sierawski - Expansion of Radiation Hardness Assurance Tool Suite	2522 K
1045 - Osheroff - Wide Band-Gap (WBG) and Power Device Testing Update 2022	2740 K
1110 - Sengupta - Development of SEB-Immune High Voltage SiC Power Devices for Lunar Applications	2171 K
1130 - Mondy/Tiu - Reliability Study of Enhancement Mode Gallium Nitride Field Effect Transistors	1368 K
1255 - Suh - 2.5/3D-Level Packaging Technology Materials, Assembly Process, and Reliability Challenges for Space Applications	3830 K
1320 - Agarwal/Ovee - Fracture Mechanics in Electronic Parts	687 K
1345 - Heidecker - Plastic Encapsulated Microcircuit (PEM) Glass Transition Temperature (TG) Study	1081 K
1410 - Ghaffarian - NASA Guidelines BGA/DSBGA	4185 K
1450 - Flores/Switzer - Recent Issues in Laser Diode Packaging for High Reliability Applications	3605 K
1515 - Bozovich/Aziz - Photonic Integrated Circuits (PICs) for Next Generation Space Applications	2595 K
1540 - Ryder - Radiation-Susceptibility of Display Technologies for Manned Missions – 2REDPANDAS	73 K
1605 - LeRoch - Radiation Hardness Assurance for Photodetectors and Image Sensors: Development of Test Guidelines	74 K
1630 - Allen - Status Update on the Pulsed Laser Single Event Effects SEE Test Guideline Desk Reference - A NASA-NRL Collaboration	3477 K
1645 - SLU - An Investigation into the Economic Design and Use of Pulsed-Lasers to Simulate the Effects of Heavy-Ion Bombardment on Radiation-Hardened Microelectronics	459 K
15-JUN-2022-WED
File	Size
0900a - Wyrwas - NEPP Processor Enclave (NPE) Update	703 K
0900b - Guertin - ARM Radiation Testing Update	910 K
0930 - Casey - Recent Radiation Test Results on COTS AI Edge Processing ASICs	73 K
0955 - Berg - The Value of "Test-As-You-Fly": Modernizing Experimentation and Data Analysis for NASA Missions	2290 K
1040 - Wilcox - Focusing on NAND Flash SEFI Susceptibilities	767 K
1105 - Esquer - Fault Propagation in Microprocessors with Configurable Cache Memory	2037 K
1130 - Guertin - HPSC 22FDX Radiation Update	1376 K
1255 - Diventi - OSMA’s Emerging Digital “Assurance Case” Framework	2872 K
1315 - Austin - Status of NEPP Model-Based Mission Assurance Efforts	953 K
1335 - Nederlander - Model-Based Mission Assurance of Radiation Effects on Electronic Systems	2674 K
1355 - Burkhard - NASA Small Spacecraft Systems Virtual Institute: An Overview and Future Plans	1984 K
1415 - Swartwout - Smallsat Mission Assurance: Annual Checkup and New (?) Models	2248 K
1455 - Chen - Update on NESC Assessment - Recommendations on Use of COTS Parts for NASA Missions	472 K
1520 - Irom - Automotive Microelectronics in Space Missions	199920K
1545 - Scheick - Modification of MIL-STD-883 TM1019 for rapid COTS path-to-flight	744 K
1610 - Scarpulla - Commercial CMOS Failure Rates: Facts and Fictions	1338 K
1640 - Pandolf - Alternate Grade Parts Selection Tools & Processes	511 K
16-JUN-2022-THU
File	Size
0900 - Teverosky - Reliability Assurance for COTS Capacitors	695 K
0930 - DelCastillo/Teverosky - New Passives for Space: Hermetic Al Electrolytic Capacitors	2092 K
0955 - Sood/Rosol - Press-fit Connectors in Spaceflight Applications – Drivers and Challenges	1085 K
1040 - Ochs - GSFC Summary of DPAs and Fas	3049 K
1115 - Brusse - A Discussion of the Failure of a Quad Diode Module and Efforts to Assure the Flight Spares	34976 K
1130 - Rink - Development of Consensus Standards to Support IGA Analysis of Microelectronic Packages	835 K
1255 - Campola - Success from TAMU Bootcamp and NSRL Radiation Test Workshop	3216 K
1320 - Gallagher/Khandker - NASA Parts Engineering School NASA JPL – NASA GSFC Joint Task FY22	1967 K
1345 - Muldavin - GF Foundry 101	68 K
1500 - Lilani/Bergeron - System in Package Tutorial (MCM/Hybrid)	1855 K
1600 - Wyrwas - Radiation Effects and Analysis Lessons: a Scientist’s Field Instruction to Explain Radiation Testing	3065 K

... Back to the 2022 NEPP ETW Home Page